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Lecturer(s)
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Kratochvíl Jiří, RNDr. Ph.D.
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Course content
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1. Interaction of material with liquid (surface free energy, Cassie Baxter, Wenzel model of wettability) 2. Bio-interaction of surfaces (methods of cell viability and adhesion estimation, atibacterial and antiviral test) 3. Roentgen (estimation of crystallographics structure of thin films - XRD, SAXS) 4. Electron microscopy (TEM, HRTEM, SEM) 5. Diagnostics of surface by tip-like methods (topography measurement: AFM, STM, profilometry, measurement of mechanical properties: indentation, nanoindentation) 6. Chemical composition (rotational and vibrational infrared spectroscopy, Raman spectroscopy) 7. Advanced infrared spectroscopy (ATR, transmission, practical work) 8. Chemical composition (XPS, RBS) 9. Optical methods - far field (measurement of optical properties of thin films UV-VIS, fluorescence, confocal microscopy) 10. Optical methods - interference, polarization (polarimetry, spectroscopic ellipsometry, measurements of optical anisotropic material and metamaterials, SNOM) 11. Advanced spectroscopic ellipsometry (thicknes estimation, optical constants, modeling, practical work) 12. Mass spectrometry (mass spectrometers, GDOES, MALDI-TOF, ion gun) 13. Electricity and magnetism (4-point method, band-gap measurements, electrochemistry, nuclear magnetic resonance)
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Learning activities and teaching methods
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Monologic (reading, lecture, briefing), Excursion, Practical training
- Field trip
- 2 hours per semester
- Preparation for classes
- 10 hours per semester
- Preparation for exam
- 20 hours per semester
- Class attendance
- 26 hours per semester
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Learning outcomes
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The course aims on the introduction of advanced diagnostics methods of surfaces with emphasis on spectroscopic ellipsometry, infrared spectroscopy and diagnostics of thin (nano)films. The lectures will be followed by practical demonstration, using available instrumentation in the house, to prepare and to motivate students for their own (independent) work and knowledge application.
Upon completion, the student will gain basic knowledge of diagnostics of materials and surfaces. He will be theoretically acquainted with the main diagnostic methods of materials and surfaces and with the approaches to their evaluation. At the same time, he will be able to practically measure and evaluate data from infrared spectroscopy, spectroscopic ellipsometry, and UV-VIS spectrophotometry.
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Prerequisites
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The course presupposes knowledge at the bachelor's degree level in physics.
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Assessment methods and criteria
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Oral examination, Development of laboratory protocols
Acquire knowledge presented at the lectures. Student needs to answer 2/3 of questions asked at the exam.
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Recommended literature
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Kittel, Charles; McEuen, Paul. Introduction to solid state physics. Global edition. Hoboken, NJ : Wiley, 2018. ISBN 978-1-119-45416-8.
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Larkin, P. Infrared and Raman Spectroscopy: Principles and Spectral Interpretation, Elsevier, 2018. 2018.
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Tompkins, H. G., Hilfiker, J. N.. Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization, Momentum Press, 2016. 2016.
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