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Lecturer(s)
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Course content
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Content of lectures: 1. Classification of materials and their properties. 2. Basics of solid state theory. Crystal structure. 3. Thin films and surface physics. 4. Methods surface investigation. Interaction of radiation and particles with the surface. Methods for surface characterization. 5. Diagnostics methods for studying of thin films properties. Measuring structure, composition and properties of the thin films - SEM, TEM, XPS GDES, XRD, Raman spectroscopy, AFM, nanointendation. 6. Application of thin films in the industry. Principles of thin film growth, the physical properties of thin films. 7. Hard and wear resistant layers. Examples of the type of materials, their deposition and use in practice. 8. Nanostructured and functional materials for catalytic applications. 9. Ferroelectric and ferromagnetic materials for modern memory devices. 10. Modern carbon based materials - fullerenes, carbon nanotubes, carbon foam, graphene, diamond like carbon. 11. Dielectric thin films for applications of energy storage and fuel cells. 12. Thin film materials for modern imaging techniques. Liquid crystals, LED, OLED.
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Learning activities and teaching methods
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Monologic (reading, lecture, briefing)
- Preparation for classes
- 26 hours per semester
- Preparation for exam
- 25 hours per semester
- Class attendance
- 28 hours per semester
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Learning outcomes
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Learning outcomes of the course unit To acquaint students with basic concepts of solid theory and surface physics in order to gain an overview of a solid structure. To deepen students' knowledge of methods of investigation of properties of solids and surfaces. The course will focus mainly on characterization methods using neutral and charged particles or photons striking the surface. Learning outcomes of the course unit To introduce students to the basics of thin film preparation technology, their application in various branches of industry and to acquaint students with different types of materials used for specific functional applications.
The graduates will acquire an overview of methods of preparation of solids with a focus on the preparation and properties of thin films. Students will be able to interpret measurements using complex methods of surface analysis. Students will have a deeper understanding of the functioning and physical principles of the interaction of particles and radiation with the surface of a solid and the associated impact on changing the structure and properties of a solid. Students will also understand the properties of tribological or catalytic thin films and their use in practice.
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Prerequisites
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Basic course of physics at university. Basic knowledge in physics of solids.
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Assessment methods and criteria
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Oral examination
Active mastering of the curriculum in the range of lectures given by the thematic plan of the course. Exam: the oral exam will consist of answers to two questions concerning the course topics; student proves knowledge at least 75%.
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Recommended literature
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A. J. Dekker: Solid state physics, Prentice-Hall Englewood Cliffs 1958.
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A. Zangwill: Physics at Surfaces, Cambridge University Press Cambridge 1988.
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B. Rous: Materiály pro elektroniku a mikroelektroniku, SNTL Praha 1991.
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H. Bubert, H. Jenett: Surfaces and Thin Films Analysis: Principles, Instrumentation, Applications, Wiley-VCH Verlag Weinheim 2002.
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H. Czichos, T. Saito, L. Smith: Handbook of Materials Measurement Methods, Springer Verlag 2006.
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L. Eckertová: Fyzikální elektronika pevných látek, UK Praha 1992.
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L. Eckertová: Metody analýzy povrchů - elektronová mikroskopie a difrakce, Academia Praha 1996.
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P. M. Martin: Handbook of Deposition Technologies for Films and Coatings, Elsevier Oxford 2010.
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